wafer sheet resistance metrology system;wafer surface scan system;Overlay measurement system;Profiler and Step Height Measurement system
This tender is from the country of China in Asian region. The tender was published by Construction Project of Special Process Production Line of GTA Semiconductor Co.,Ltd on 04 Jun 2019 for wafer sheet resistance metrology system;wafer surface scan system;Overlay measurement system;Profiler and Step Height Measurement system. The last date to submit your bid for this tender was 18 Jun 2019. This tender is for the companies specializing in Metrology and similar sectors.
*The deadline for this tender has passed.
Tender Organisation:
Construction Project of Special Process Production Line of GTA Semiconductor Co.,Ltd
Tender Sector:
Tender Service:
Worldwide
Tender Region:
Tender Country:
Tender CPV:
37321301 : Metrology
Tender Document Type:
Tender Notice
Tender Description:
wafer sheet resistance metrology system;wafer surface scan system;Overlay measurement system;Profiler and Step Height Measurement system
Tender Bidding Type:
Tender Notice No:
Tender Document:
- 1 week to go
- 15 Days to go
- More than 15 days to go
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