This tender with tender notice no. JPA2026ID76_pub01 is from the country of Belgium in Europe region. The tender was published by Imec EU Pilot line NV on 01 Jul 2026 for WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE PFIB-SEM SYSTEM. The last date to submit your bid for this tender is 06 Jul 2026. This tender is for the companies specializing in Electron microscopes, Ion and molecular microscopes, Ion microscopes, Scanning probe microscopes and similar sectors. Tender Impulse ID: 13605263.
Tender Notice No:
JPA2026ID76_pub01
Tender Organisation:
Imec EU Pilot line NV
Tender Sector:
Tender Service:
Worldwide
Tender Region:
Tender Country:
Tender CPV:
38511000 : Electron microscopes
38512000 : Ion and molecular microscopes
38512100 : Ion microscopes
38514200 : Scanning probe microscopes
Tender Document Type:
Tender Notice
Tender Description:
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE PFIB-SEM SYSTEM
Tender Bidding Type:
Tender Document:
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