Critical Dimension Scanning Electron Microscope with Analysis Device 1 set
This tender is from the country of Japan in Asian region. The tender was published by National University Corporation on 29 Sep 2025 for Critical Dimension Scanning Electron Microscope with Analysis Device 1 set. The last date to submit your bid for this tender was 11 Oct 2025. This tender is for the companies specializing in Scanning electron microscopes, Transmission electron microscope, Scanning probe microscopes and similar sectors.
*The deadline for this tender has passed.
Tender Organisation:
National University Corporation
Tender Sector:
Tender Service:
Worldwide
Tender Region:
Tender Country:
Tender CPV:
38511100 : Scanning electron microscopes
38511200 : Transmission electron microscope
38514200 : Scanning probe microscopes
Tender Document Type:
Tender Notice
Tender Description:
Critical Dimension Scanning Electron Microscope with Analysis Device 1 set
Tender Bidding Type:
Tender Notice No:
Tender Document:
- 1 week to go
- 15 Days to go
- More than 15 days to go
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