The Delft University of Technology in Netherlands from Europe region had released this tender for Focused Ion Beam Scanning Electron Microscope with tender notice no. 415266-tenderned_nl published on 11 Mar 2026. The tender expired on 26 Mar 2026. This tender is sourced from Tenderned and is eligible for suppliers interested in Diagnostics and radiodiagnostic devices and supplies, Laboratory, optical and precision equipments (excl. glasses), Miscellaneous evaluation or testing instruments. Interested bidders can obtain further information including complete bid documents or ways to participate by registering on Tender Impulse and referencing via Tender Impulse ID 11825340.
*The deadline for this tender has passed.
Tender Notice No:
415266-tenderned_nl
Tender Organisation:
Delft University of Technology
Tender Sector:
Tender Service:
Worldwide
Tender Region:
Tender Country:
Tender CPV:
33124000 : Diagnostics and radiodiagnostic devices and supplies
38000000 : Laboratory, optical and precision equipments (excl. glasses)
38900000 : Miscellaneous evaluation or testing instruments
Tender Source:
Tenderned
Tender Document Type:
Tender Notice
Tender Description:
Focused Ion Beam Scanning Electron Microscope
Tender Bidding Type:
Tender Document:
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The tender has been issued by Delft University of Technology in Netherlands. Such a type of tender falls under Diagnostics and radiodiagnostic devices and supplies, Laboratory, optical and precision equipments (excl. glasses), Miscellaneous evaluation or testing instruments, within the Adhesive & Labels Tenders sector, and is listed on Tender Impulse under notice number 415266-tendernednl.
The notice was published on 11 Mar 2026 and submissions close on 26 Mar 2026. Late bids are rarely accepted in public procurement, so aim to have your documents ready several days before the closing date.
It is classified under CPV codes 33124000, 38000000, 38900000, which correspond to Diagnostics and radiodiagnostic devices and supplies, Laboratory, optical and precision equipments (excl. glasses), Miscellaneous evaluation or testing instruments. If your company supplies these products or services, these are the codes to save in your alert profile so no matching tender passes you by.
No - and this matters. Tender Impulse is a tender aggregation and alert service: we collect procurement notices from official sources around the world and list them in one place. We do not receive, forward or evaluate bids. Your bid for this tender must be submitted directly to Delft University of Technology, using the method described in the original tender document, before 26 Mar 2026. Tender Impulse provides complete assistance in submitting all bids posted on its website.
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Suppliers must verify technical specifications, the delivery schedules and any other intrinsic details as provided in the complete bid documents before deciding to submit their bids. All necessary certifications and supplier registrations must be undertaken before participation.
The procurement is applicable to companies in the Diagnostics and radiodiagnostic devices and supplies, Laboratory, optical and precision equipments (excl. glasses), Miscellaneous evaluation or testing instruments and related industries. If you belong to this industry, you can review the technical documents before assessing your relevance to your company.
The public procurement trends for Focused Ion Beam Scanning Electron Microscope can be assessed by viewing historical data and buying patterns for this product. Subscribed members can view and even download reports of tenders released in the past for their market research. This shall allow them to carefully prepare a compelling bid.
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