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13244555WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM, WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTECountry: BelgiumDeadline06 Sep 202613245959Supply of a special X-ray detector configuration for a scanning electron microscope for the analysis of light elements in thin filmsCountry: GermanyDeadline06 Sep 202613247169Delivery, installation, and maintenance of a Dual-beam plasma ion and scanning Electron MicroscopeCountry: NetherlandsDeadline07 Sep 202613427401MEBMHN_A1 Acquisition of a scanning electron microscopeCountry: SwitzerlandDeadline07 Sep 202613518194Supply of a scanning electron microscope equipped with an EDS spectrometer and specific accessoriesCountry: FranceDeadline26 Aug 202613528540Supply of a scanning electron microscope equipped with an eds spectrometer and specific accessoriesCountry: FranceDeadline26 Aug 202613540705Scanning Electron MicroscopeCountry: DenmarkDeadline31 Aug 202613540885Scanning Electron MicroscopeCountry: DenmarkDeadline31 Aug 202613548894Scanning Electron MicroscopeCountry: DenmarkDeadline31 Aug 202613656204Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)Country: SwedenDeadline23 Aug 202613668745Procurement of a Scanning Electron Microscope for The Norwegian Armed Forces Laboratory Services (FOLAT).Country: NorwayDeadline28 Aug 202613729927Acquisition and installation of a field emission (FEG) scanning electron microscope (SEM)Country: CanadaDeadline25 Aug 202613755604Purchase delivery and installation of a compact scanning electron microscopeCountry: BelgiumDeadline13 Aug 202613778768Delivery, installation and commissioning of a scanning electron microscopeCountry: GermanyDeadline11 Aug 202613840976Delivery of a scanning electron microscopeCountry: PolandDeadline13 Aug 202613853325Cryo-Focused Ion Beam - Scanning Electron MicroscopeCountry: BelgiumDeadline20 Aug 202613870890Cryo-Focused Ion Beam - Scanning Electron MicroscopeCountry: BelgiumDeadline21 Aug 202613933034Hefei University of Technology in situ high-resolution field emission scanning electron microscope correction announcement 1Country: ChinaDeadline10 Aug 202613996472High-resolution Scanning electron microscope (SEM)Country: FinlandDeadline04 Sep 202614034040[51963]Real-time scanning electron microscope specimen holderCountry: KoreaDeadline12 Aug 202614070850Supply of a scanning electron microscope and its analytical detectorsCountry: FranceDeadline30 Sep 202614095322Field Emission Gun Scanning Electron Microscope AS PER THE ATTACHED SPECIFICATIONCountry: IndiaDeadline08 Sep 202614108589Purchase of a Focused Ion Beam-Scanning Electron Microscope, 1 setCountry: JapanDeadline15 Aug 202614125576Supply, delivery, installation and commissioning of one (1) unit of Tungsten Filament Scanning Electron MicroscopeCountry: SingaporeDeadline11 Aug 202614155530IFB 168030 - Rebid of Schottky Type Scanning Electron Microscope (FE-SEM) with Energy Dispersive Spectroscopy (EDS) CapabilitiesCountry: USADeadline26 Aug 2026
