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13244555WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM, WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTECountry: BelgiumDeadline06 Sep 202613540801FIB & SEM system (HHI-01) - PR1216644-3220-P, FIB & SEM system (HHI-01) - PR1216644-3220-PCountry: GermanyDeadline23 Sep 202613563736FIB & SEM system (HHI-01) - PR1216644-3220-P, FIB & SEM system (HHI-01) - PR1216644-3220-PCountry: GermanyDeadline27 Sep 202613895833FIB & SEM system (HHI-01) - PR1216644-3220-P, FIB & SEM system (HHI-01) - PR1216644-3220-PCountry: GermanyDeadline18 Oct 202613960046FIB & SEM system (HHI-01) - PR1216644-3220-P, FIB & SEM system (HHI-01) - PR1216644-3220-PCountry: GermanyDeadline20 Oct 202614115555FIB & SEM system (HHI-01) - PR1216644-3220-P, FIB & SEM system (HHI-01) - PR1216644-3220-PCountry: GermanyDeadline29 Oct 202613996472High-resolution Scanning electron microscope (SEM)Country: FinlandDeadline04 Sep 202614021017Független mérnöki feladatok ellátása BUBECountry: HungaryDeadline25 Oct 202613218879Rasterelektronenmikroskope E-Sem und KryoSemCountry: GermanyDeadline05 Sep 202613401775CD-SEM Rasterelektronenmikroskop - PR1153351-2390-WCountry: GermanyDeadline15 Sep 202613656204Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)Country: SwedenDeadline23 Aug 202613667440(DAG) aquisição de serviços de recursos para os projetos referentes à prescrição eletrónica médica, exames sem papel e reconciliação terapêutica, referente ao Pilar 4 -Country: AndorraDeadline01 Oct 202613729927Acquisition and installation of a field emission (FEG) scanning electron microscope (SEM)Country: CanadaDeadline25 Aug 202613758664Avviso di indagine di mercato per la verifica di unicità del fornitore per laffidamento mediante procedura negoziata senza previa pubblicazione di un bando di gara ex art. 76 co.Country: ItalyDeadline07 Oct 202613791992A47 - interchange no 12 - sardon direction 2 - sem perimeter - phase 2 rm65- roundabout - greenwayCountry: FranceDeadline07 Sep 20261383557526067 420 Intercultural interpreting for asylum seekersCountry: SwitzerlandDeadline31 Aug 202613848469UW SEM Renewal of secondary technology and medium voltage systemCountry: SwitzerlandDeadline10 Sep 202613854583UW SEM Erneuerung Sekundärtechnik und MittelspannungsanlageCountry: SwitzerlandDeadline09 Sep 202613876601Services dassurances pour la SEM Sarreguemines Confluences HabitatCountry: FranceDeadline03 Sep 202613911133CD-SEM Rasterelektronenmikroskop - PR1153351-2390-WCountry: GermanyDeadline18 Oct 202613911299Poland - Research and measurement machines and equipment - SZP/243-231/2026: Delivery of a multifunctional electron microscope for combined FIB-SEM techniques, with an ion gun, a RCountry: PolandDeadline19 Aug 202613915610SZP/243-231/2026: Dostawa multifunkcjonalnego mikroskopu elektronowego do technik łączonych FIB-SEM, z działem jonowym, spektrometrem ramanowskim, analizatorem składu chemiczneCountry: PolandDeadline18 Oct 202613938040Infrastruktúra adattár és forg.irányítási rendsz.Country: HungaryDeadline19 Oct 202613942347Suministro, instalación y puesta en funcionamiento de un equipo Electron Beam Lithography tool up to 8-inch wafers (UPV04) y un equipo SEM (UPV13) para la Pilot Line de la UPVCountry: SpainDeadline14 Sep 202613995938UPOL/PřF/KEF - Systém FIB-SEM včetně analytických technik a nanoindentaceCountry: Czech RepublicDeadline25 Aug 2026
